{"id":14687,"date":"2025-08-15T12:00:00","date_gmt":"2025-08-15T17:00:00","guid":{"rendered":"https:\/\/www.dmcinfo.com\/our-work\/bed-of-nails-pcb-functional-test-system-automotive-gauge-cluster-controller-2\/"},"modified":"2025-08-27T10:57:20","modified_gmt":"2025-08-27T15:57:20","slug":"bed-of-nails-pcb-functional-test-system-automotive-gauge-cluster-controller","status":"publish","type":"our_work","link":"https:\/\/www.dmcinfo.com\/our-work\/bed-of-nails-pcb-functional-test-system-automotive-gauge-cluster-controller\/","title":{"rendered":"Bed of Nails PCB Functional Test System, Automotive Gauge Cluster Controller"},"content":{"rendered":"\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-28f84493 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\" style=\"flex-basis:70%\">\n<p>DMC&#8217;s PCB functional test solution integrates National Instruments test and measurement technology with a flexible fixture design to ensure the system (and investment) is ready to adapt as new requirements are identified.<\/p>\n\n\n\n<p>The gauge cluster PCB functional test system (pictured on the right) highlights DMC\u2019s ability to deliver fully integrated turnkey test applications. DMC takes pride in assembling strategic, skilled, multi-disciplinary teams that combine DMC&#8217;s vast engineering and software development capabilities.<\/p>\n\n\n\n<p>The test system provides complete product test and verification capabilities. It can download firmware and preform pre-power up, open\/short verification, communication bus, and power consumption testing. At the heart of the test system lies an NI PXI chassis and multiple measurement devices, including a dual-channel power supply, source measurement unit, CAN communication cards, and switch matrix.<\/p>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\" style=\"flex-basis:30%\">\n<figure class=\"wp-block-image size-full is-style-rounded is-style-rounded--1\"><img decoding=\"async\" width=\"713\" height=\"909\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165841\/471-1271-1.png\" alt=\"\" class=\"wp-image-14683\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165841\/471-1271-1.png 713w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165841\/471-1271-1-235x300.png 235w\" sizes=\"(max-width: 713px) 100vw, 713px\" \/><\/figure>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full is-resized is-style-default\"><img decoding=\"async\" width=\"452\" height=\"752\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2019\/03\/16142844\/bed-of-nails-pcb-functional-test-system.jpg\" alt=\"Bed of Nails PCB Functional Test System\" class=\"wp-image-36694\" style=\"width:207px;height:auto\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2019\/03\/16142844\/bed-of-nails-pcb-functional-test-system.jpg 452w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2019\/03\/16142844\/bed-of-nails-pcb-functional-test-system-180x300.jpg 180w\" sizes=\"(max-width: 452px) 100vw, 452px\" \/><\/figure>\n<\/div>\n<\/div>\n\n\n\n<p>DMC developed a LabVIEW application that allows flexible test sequencing across different test stands. In addition, we integrated generic PC peripherals with the LabVIEW application to ensure that high-level functionality of common interfaces (Ethernet, USB, and Serial) was verified. Pairing precision instruments with everyday IO in a custom test sequence allowed for end-to-end product testing and was made possible by the NI TestStand development platform.<\/p>\n\n\n\n<div class=\"wp-block-columns is-layout-flex wp-container-core-columns-is-layout-28f84493 wp-block-columns-is-layout-flex\">\n<div class=\"wp-block-column is-layout-flow wp-block-column-is-layout-flow\" style=\"flex-basis:60%\">\n<p>The test system is also fully integrated with a Microsoft SQL server database to ensure compliance with modern production requirements. Database-level traceability, especially in the automotive industry, allows manufacturers to confidently and securely store production data with ease of recall for internal reporting or external audit. SQL offers an extensive toolchain for custom data analysis and process performance analysis to ensure the system continues to run reliably throughout its lifecycle.<\/p>\n<\/div>\n\n\n\n<div class=\"wp-block-column is-vertically-aligned-center is-layout-flow wp-block-column-is-layout-flow\" style=\"flex-basis:30%\">\n<figure class=\"wp-block-image size-full is-style-rounded is-style-rounded--2\"><img decoding=\"async\" width=\"1550\" height=\"933\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3.png\" alt=\"\" class=\"wp-image-14685\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3.png 1550w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-300x181.png 300w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-1024x616.png 1024w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-768x462.png 768w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-1536x925.png 1536w\" sizes=\"(max-width: 1550px) 100vw, 1550px\" \/><\/figure>\n\n\n\n<figure class=\"wp-block-image size-full is-style-rounded is-style-rounded--3\"><img decoding=\"async\" width=\"2560\" height=\"1440\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106.jpg\" alt=\"\" class=\"wp-image-14686\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106.jpg 2560w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-300x169.jpg 300w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-1024x576.jpg 1024w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-768x432.jpg 768w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-1536x864.jpg 1536w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-2048x1152.jpg 2048w\" sizes=\"(max-width: 2560px) 100vw, 2560px\" \/><\/figure>\n<\/div>\n<\/div>\n\n\n\n<p>PCB function test systems are prevalent in modern production environments. Today, Embedded PCB devices have many sub-systems, so achieving complete test coverage with automated test solutions can be demanding. By utilizing a flexible hardware design, customizable software technologies, and partners with the expertise to integrate the system components, manufacturers can ensure a highly productive and effective path to delivering high-quality products.<\/p>\n\n\n\n<p><strong>Learn more about DMC&#8217;s <a href=\"https:\/\/www.dmcinfo.com\/services\/test-and-measurement-automation\">Test and Measurement<\/a> and <a href=\"https:\/\/www.dmcinfo.com\/services\/embedded-development-and-embedded-programming\">Embedded<\/a>\u00a0expertise and\u00a0<a href=\"https:\/\/www.dmcinfo.com\/contact\/\">contact us<\/a>\u00a0for your next project.<\/strong><\/p>\n\n\n\n<figure class=\"wp-block-gallery has-nested-images columns-default wp-block-gallery-5 is-layout-flex wp-block-gallery-is-layout-flex\" style=\"border-radius:20px\">\n<figure class=\"wp-block-image size-full is-style-rounded is-style-rounded--4\"><img decoding=\"async\" width=\"713\" height=\"909\" data-id=\"14683\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165841\/471-1271-1.png\" alt=\"\" class=\"wp-image-14683\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165841\/471-1271-1.png 713w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165841\/471-1271-1-235x300.png 235w\" sizes=\"(max-width: 713px) 100vw, 713px\" \/><\/figure>\n\n\n\n<figure class=\"wp-block-image aligncenter size-full is-style-default\"><img decoding=\"async\" width=\"452\" height=\"752\" data-id=\"36694\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2019\/03\/16142844\/bed-of-nails-pcb-functional-test-system.jpg\" alt=\"Bed of Nails PCB Functional Test System\" class=\"wp-image-36694\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2019\/03\/16142844\/bed-of-nails-pcb-functional-test-system.jpg 452w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2019\/03\/16142844\/bed-of-nails-pcb-functional-test-system-180x300.jpg 180w\" sizes=\"(max-width: 452px) 100vw, 452px\" \/><\/figure>\n<\/figure>\n\n\n\n<figure class=\"wp-block-gallery has-nested-images columns-default is-cropped wp-block-gallery-8 is-layout-flex wp-block-gallery-is-layout-flex\">\n<figure class=\"wp-block-image size-full is-style-rounded is-style-rounded--6\"><img decoding=\"async\" width=\"1550\" height=\"933\" data-id=\"14685\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3.png\" alt=\"\" class=\"wp-image-14685\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3.png 1550w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-300x181.png 300w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-1024x616.png 1024w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-768x462.png 768w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165839\/471-1273-3-1536x925.png 1536w\" sizes=\"(max-width: 1550px) 100vw, 1550px\" \/><\/figure>\n\n\n\n<figure class=\"wp-block-image size-full is-style-rounded is-style-rounded--7\"><img decoding=\"async\" width=\"2560\" height=\"1440\" data-id=\"14686\" src=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106.jpg\" alt=\"\" class=\"wp-image-14686\" srcset=\"https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106.jpg 2560w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-300x169.jpg 300w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-1024x576.jpg 1024w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-768x432.jpg 768w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-1536x864.jpg 1536w, https:\/\/cdn.dmcinfo.com\/wp-content\/uploads\/2025\/05\/27165838\/unnamed-file-106-2048x1152.jpg 2048w\" sizes=\"(max-width: 2560px) 100vw, 2560px\" \/><\/figure>\n<\/figure>\n","protected":false},"excerpt":{"rendered":"<p>DMC&#8217;s PCB functional test solution integrates National Instruments test and measurement technology with a flexible fixture design to ensure the system (and investment) is ready to adapt as new requirements are identified. The gauge cluster PCB functional test system (pictured on the right) highlights DMC\u2019s ability to deliver fully integrated turnkey test applications. DMC takes [&hellip;]<\/p>\n","protected":false},"author":8,"featured_media":37458,"template":"","meta":{"customer":"Ametek","summary":"Printed Circuit Board (PCB) functional testing is a critical process in electronics manufacturing. Embedded PCB devices are becoming ubiquitous in products, provide intelligence to everything from basic consumer goods to complex industrial equipment.\r\n\r\nDMC delivered a turnkey, dual fixture (2-up) PCB Functional test system to help our client validate a new product. Backed by National Instruments TestStand, DMC applied LabVIEW test code and sequencing to automate the production testing of an automotive gauge cluster controller. With the capability of custom LabVIEW tools and the power of NI TestStand&rsquo;s batch process capability, DMC provided a parallelized test platform to handle the production rates of the automotive product.\r\n\r\nThe system included a custom-designed fixture tailored to the specific device under test. DMC delivered a flexible fixture design with the ability to adapt new nest configurations should future product demands and features change. The combination of flexible hardware and customizable software ensures the greatest longevity of the test solution investment.\r\n&nbsp;","description":"","customer_benefits":"<ul>\r\n<li>Turnkey Production Test Cell<\/li>\r\n<li>Parallelized operation, improved throughput<\/li>\r\n<li>Customized software platform, pairing LabVIEW and NI Test Stand<\/li>\r\n<li>Flexible fixture design for future DUT model scalability<\/li>\r\n<\/ul>","components_used":"<ul>\r\n<li><a href=\"http:\/\/www.ni.com\/en-us\/shop\/labview.html\" target=\"_blank\">National Instruments - LabVIEW<\/a><\/li>\r\n<li><a href=\"http:\/\/www.ni.com\/en-us\/shop\/electronic-test-instrumentation\/application-software-for-electronic-test-and-instrumentation-category\/what-is-teststand.html\" target=\"_blank\">National Instruments - TestStand<\/a><\/li>\r\n<li><a href=\"http:\/\/www.ni.com\/en-us\/shop\/pxi.html\" target=\"_blank\">National Instruments - PXI Test and Measurement Hardware<\/a><\/li>\r\n<li><a href=\"https:\/\/www.microsoft.com\/en-us\/sql-server\/sql-server-editions-express\" target=\"_blank\">Microsoft - SQL Server Express<\/a><\/li>\r\n<\/ul>","project":"Programming Functional Test Stand","author":"Jesse Batsche","notes":""},"work_category":[678,697,685,698,684,706],"class_list":["post-14687","our_work","type-our_work","status-publish","has-post-thumbnail","hentry","work_category-automotive","work_category-embedded-development-programming","work_category-labview","work_category-product-development","work_category-test-measurement-automation","work_category-test-stand"],"yoast_head":"<title>Bed of Nails PCB Functional Test System, Automotive Gauge Cluster Controller | DMC, Inc.<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/www.dmcinfo.com\/our-work\/bed-of-nails-pcb-functional-test-system-automotive-gauge-cluster-controller\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Bed of Nails PCB Functional Test System, Automotive Gauge Cluster Controller\" \/>\n<meta property=\"og:description\" content=\"DMC&#8217;s PCB functional test solution integrates National Instruments test and measurement technology with a flexible fixture design to ensure the system (and investment) is ready to adapt as new requirements are identified. The gauge cluster PCB functional test system (pictured on the right) highlights DMC\u2019s ability to deliver fully integrated turnkey test applications. 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flexible fixture design to ensure the system (and investment) is ready to adapt as new requirements are identified. The gauge cluster PCB functional test system (pictured on the right) highlights DMC\u2019s ability to deliver fully integrated turnkey test applications. 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